搜索结果: 1-15 共查到“Atomic Force Microscopy”相关记录21条 . 查询时间(0.125 秒)
第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
Vesicle Adsorption and Lipid Bilayer Formation on Glass Studies by Atomic Force Microscopy
crystal structure single crystal X-ray diffraction rare earth metal transition metal silicon
2016/5/24
The adsorption of phosphatidylcholine (PC) vesicles (30, 50, and 100 nm nominal diameters) and of dye-labeled PC vesicles (labeled with 6% Texas Red fluorophore (TR) and encapsulated carboxy fluoresce...
Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone
Atomic Force Microscopy Scanning probe microscopy
2014/11/6
Scanning probe microscopy (SPM) has been in use for 30 years, and the form of SPM known as atomic force microscopy (AFM) has been around for 25 of those years. AFM has been used to produce high resolu...
State Feedback Control for Adjusting the Dynamic Behavior of a Piezoactuated Bimorph Atomic Force Microscopy Probe
State Feedback Control Dynamic Behavior Piezoactuated Bimorph Atomic Microscopy Probe Atomic Physics
2012/4/24
We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resona...
The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy
Role Nonlinear Dynamics Quantitative Atomic Force Microscopy
2012/2/27
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motio...
An in-plane gate transistor fabricated by using the atomic force microscopy (AFM) lithography is investigated in this paper. By performing repeated oxidation and de-oxidation procedures by using AFM f...
RSC remodeling of oligo-nucleosomes: an atomic force microscopy study
RSC oligo-nucleosomes atomic force microscopy study
2011/1/5
RSC is an essential chromatin remodeling factor that is required for the control of several processes including transcription, repair and replication. The ability of RSC to relocate centrally position...
Topographic and electronic contrast of the graphene moiré on Ir(111) probed by scanning tunneling microscopy and non-contact atomic force microscopy
Topographi electronic contrast tunneling microscopy non-contact atomic force microscopy
2010/11/23
Epitaxial graphene grown on single crystal transition metal surfaces typically exhibits a moiré
pattern due to the lattice mismatch between graphene and the underlying metal surface. We use si-multan...
Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Potential contributions noncontact atomic force microscopy the future Casimir force measurements
2010/11/5
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is enc...
Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy
Water distribution solid/liquid interfaces visualized frequency modulation atomic force microscopy
2010/10/12
Interfacial phenomena at solid/water interfaces play an important role in a wide range of industrial technologies and biological processes. However, it has been a great challenge to directly probe the...
Investigation of the topography of magnetron-deposited Cu/Ni multilayers by X-ray reflectometry and atomic force microscopy
multilayers Cu/Ni X-ray reflectometry (XRR)
2011/5/11
This paper presents the results of research of Cu/Ni multilayers magnetron-deposited on an Si (100) substrate. The thickness of Cu sublayers was identical in all multilayers and equalled 2 nm. The th...
Application of dynamic impedance spectroscopy to atomic force microscopy
atomic force microscopy dynamic electrochemical impedance spectroscopy non-stationarity
2010/10/12
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials.It is useful to combine those...
期刊信息
篇名
Inter-Spherulite Voundary Strucrure in Bulk-crystallized Polethylenes Directly Observed by Atomic Force Microscopy
语种
英文
撰写或编译
作者
滕洪祥,史燚,金熹高
第一作者单位
刊物名称
Polymer Journal
页面
2003, 35, 436
出版日期
2...
We consider the problem of uncertainty in geometrically linear measurements in scanning probe microscopy (SPM) represented by atomic force microscopy (AFM). The uncertainties under consideration are a...
Dynamic Atomic Force Microscopy Studies to Characterize Heterogeneous Surfaces
Dynamic Atomic Force Microscopy Studies Heterogeneous Surfaces
2009/12/22
Dynamic Atomic Force Microscopy Studies to Characterize Heterogeneous Surfaces.