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Numerical Simulation of Nano Scanning in Intermittent-Contact Mode AFM under Q control
Numerical Simulation Nano Intermittent-Contact Mode AFM Q control Atomic Physics
2012/4/24
We investigate nano scanning in tapping mode atomic force microscopy (AFM) under quality (Q) control via numerical simulations performed in SIMULINK. We focus on the simulation of whole scan process r...
Robust Repetitive Controller for Fast AFM Imaging
Robust Repetitive Controller Fast AFM Imaging Atomic Physics
2012/4/24
Currently, Atomic Force Microscopy (AFM) is the most preferred Scanning Probe Microscopy (SPM) method due to its numerous advantages. However, increasing the scanning speed and reducing the interactio...